LC4256V-75T100I

IC CPLD 256MC 7.5NS 100TQFP
part number has RoHS
1 : $0.0000

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Dasenic Part Number
83F26E-DS
Manufacturer Part #
LC4256V-75T100I

Customer Reference

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83 In Stock

MOQ
1PCS
Delivery Time
Ship Within 48 Hours
Packaging
100-LQFP

Quantity

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ManufacturerLattice Semiconductor
Integrated Circuits (ICs)Complex Programmable Logic Devices (CPLDs)
Product StatusObsolete
Operating Temperature-40°C ~ 105°C (TJ)
Mounting TypeSurface Mount
Package / Case100-LQFP
Supplier Device Package100-TQFP (14x14)
Programmable TypeIn System Programmable
Delay Time tpd(1) Max7.5 ns
Voltage Supply - Internal3V ~ 3.6V
Number of Logic Elements/ Blocks16
Number of Macrocells256
Number of I/ O64
SeriesispMACH® 4000V
PackagingTray

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Environmental & Export Classifications
EU RoHS StatusRoHS Compliant
REACH StatusVendor is not defined
US ECCNProvided as per user requirements
China RoHS StatusOrange Symbol: Safe for use during the environmental protection period
Description (v) Features
The LC4256V-75T100I is an integrated circuit (IC) component from the LC4256V series developed by Lattice Semiconductor Corporation. This IC component offers a wide variety of features that make it suitable for various applications. Here is an overview of the key features of the LC4256V-75T100I: 1. Logic Cells: The LC4256V-75T100I chip is equipped with 2,560 logic cells, allowing for complex digital circuit designs. 2. Look-Up Tables (LUTs): It consists of 1,280 configurable 4-input LUTs that can be programmed to implement various logical functions, making it highly versatile. 3. Macrocells: With 80 macrocells available, the LC4256V-75T100I provides more complex programmable functionality, allowing for the implementation of advanced features. 4. Embedded RAM: This IC component incorporates 36 kilobits (4,096 bytes) of embedded RAM, which can be utilized as data storage for temporary or intermediate results during operation. 5. I/O Pins: The LC4256V-75T100I offers 100 general-purpose input/output (I/O) pins, facilitating the connection to external devices such as sensors, displays, or other digital systems. 6. System Level Testing: It includes boundary scan capabilities compliant with IEEE Standard 1149.1, making it easier to test and diagnose the chip at the system level

In Stock: 83

MOQ
1PCS
Packaging
100-LQFP
Delivery Time
Ship Within 48 Hours
Shipping Origin
Shenzhen or Hong Kong Warehouse

Quantity

Get pricing info from knowledgeable sales

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